22:06 07.01.2019Image Metrology has moved to DTU Science ParkWe have today moved to our new facilities at DTU Science Park, located on the campus of the Danish Technical University, Copenhagen and looking forward to being part of an inspiring environment among other innovative companies.
15:29 11.12.201820 Years AnniversaryWe are celebrating our 20 years Anniversary and look forward to an even closer cooperation with our interesting customers with exciting projects, partners, distributors and colleagues in the coming years.
12:12 17.09.2018SPIP™ release 6.7.5We are happy to announce the newest SPIP™ release 6.7.5 and invite you to download and try it yourself. Download SPIP In this release we have included many fixes and improvements requested by our SPIP users working with SPM and SEM images, see detailed release notes here:
12:17 10.08.2018Join us at the ECOSS conference, Aarhus DenmarkWe will be exhibiting at ECOSS2018 August 26-29 and look forward to meeting you at our booth no. 2 for free image processing advice and a SPIP demo. Feel free to bring your own image data from your research and our experts will be pleased to give you detailed advice on how to process your own data.
10:38 05.04.2017Release: SPIP 6.7!With the new and improved detection and splitting options SPIP™ version 6.7 has taken a giant leap towards easy and robust particle analysis in SPM and SEM images.
11:02 21.02.2017How to process information from Scanning Probe MicroscopySPM is a technique that uses a very sharp probe to scan over a surface in a raster pattern. When the probe is within atomic distance of the surface an AFM (Atomic Force Microscopy) probe can sense the repulsive and attractive forces from the surface.
11:47 20.11.2016Join us at MRS Fall Meeting & Exhibit in BostonWe will be exhibiting at the 2016 MRS Fall Meeting in Boston on November 29-December 1., and look forward to meeting you at our booth no. 1100 for free image processing advice and...
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