** NEW SOFTWARE **      topoStitch™ - Fast and accurate stitching of topographic images!      ** NEW SOFTWARE **
 
Home
Image Metrology A/S

Phone:+45 469 234 00
Fax:+45 469 234 01
info@imagemet.com



Japanese (short)
Company News
See also our newsletter archive.

2013-05-15: Image Metrology Releases topoStitch™ for stitching topographic images
topoStitch™ is the fastest and most accurate way to stitch topographic images.

2013-01-22: NanoMagnetics Instruments LTD. Becomes SPIP OEM Distributor
NanoMagnetics Instruments LTD. now offers SPIP together with their instruments.

2013-01-22: C-K Engineering, Inc. Becomes SPIP OEM Distributor
C-K Engineering, Inc. now offers SPIP together with their instruments.

2012-07-06: Ionscope Ltd Becomes SPIP OEM Distributor
Ionscope Ltd now offers SPIP together with their instruments.

2012-03-15: SPIP6 Released - the best has just gotten better!
The new SPIP6 offers a brand new intuitive user interface with easy access to most of the powerful tools in SPIP.

2011-12-07: SPIP6 Beta Released
The new SPIP6 focuses by its new intuitive user interface on ease of use and productivity. Pre-Order Now and Get Extended Maintenance Service.

2011-06-27: Award Won by Scientists Using SPIP™ for Quantification of Landscape Structure
At the US-IALE 2011 McGarigal, K., S. Tagil, and S.A. Cushman received an Honorable Mention of their paper "Surface metrics: an alternative to patch metrics for the quantification of landscape structure" in which SPIP™ is used extensively.

2010-12-01: Free Webinar on Force Curve and Force Volume Analysis
We have recently added the DMT fitting model to SPIP™ for Young’s modulus calculation and the possibility to measure work of adhesion and unfolding energy and invite you to participate in a free webinar on Force Curve and Force Volume Analysis.

2010-07-28: Job Opening in Software Development
We are currently looking for a Software Developer for development of state-of-the-art microscope software.

2010-03-23: SPIP 5.1 - Easy License Sharing
SPIP 5.1 offers improved license management and easy license sharing

2010-01-05: NT-MDT America Inc. Becomes SPIP OEM Distributor
NT-MDT America Inc. now offers SPIP together with their range of nanotechnology research instruments.

2009-12-21: Image Metrology joins the research project "Processes and Software for Manufacturing and Characterizing Industrial Multifunctional Surfaces" approved by Danish National Advanced Technology Foundation
“Design should enhance wind turbines’ lifetime” Image Metrology A/S, STRECON A/S, Vestas Wind System A/S and DTU Mekanik will develop equipment and knowledge to the design of the surfaces, which could increase life expectancy of mechanical parts, for an example, wind turbine gearboxes. It will save billions. Danish National Advanced Technology Foundation will invest 7.6 million in period of four years.

2009-11-18: Free Webinar on Particle & Pore Analysis
You can now receive a 10% discount on all SPIP orders including our successful Particle and Pore Analysis Module and participate in a free webinar.

2009-07-31: NT-MDT Europe BV Becomes SPIP OEM Distributor
NT-MDT Europe BV now offers SPIP together with their range of nanotechnology research instruments.

2009-06-24: SPIP 5 - A Giant Leap for Particle and Pore Analysis
Detecting and quantifying particles, pores and grains have never been easier. With the new Particle & Pore Analysis Module in SPIP 5 you can detect any type of surface feature on virtually any background.

2008-11-21: 10th Year Company Anniversary Reception in Boston
You are hereby invited to join us in Boston for our 10th year company anniversary reception.

2008-11-20: SPIP 4.8 Offers Extensive User Plug-In Capabilities and Chinese Interface
The Plug-In interface has been extensively improved and now allows you to add and integrate your own roughness parameters and file importers in SPIP. Furthermore, SPIP has been translated into Chinese.

2008-11-11: Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH Signs SPIP OEM Agreement
Gesellschaft für Bild- und Signalverarbeitung (GBS) mbH offers SPIP together with their White-Light Interferometry.

2008-08-21: Unisoku Signs SPIP OEM Agreement
Unisoku now offers SPIP together with the companys renowned instruments.

2008-06-04: SPIP 4.7 Brings New Life to Force Volume Analysis
The Force Curve Analysis module has been extensively improved and now offers unmatched functionality for Force Volume images and model fitting to indentation and pulling experiments.

2008-02-18: Professor Woochul Yang Finds a Free SPIP License in Korea
Professor Woochul Yang was the first to claim the last of the 3 stashed SPIP Licenses.

2008-02-12: Mr. Silvano Rech Collects Free SPIP License in Italy
Mr. Silvano Rech was the first person to show up at the published coordinates and claim the full SPIP License.

2007-12-13: Third Free SPIP License Stashed at 45deg 3:57.36N, 11deg 47:39.62E
As part of the SPIP Global Cache Hunt 2007 we have stashed the third and final full SPIP license at 45deg 3:57.36N (latitude), 11deg 47:39.62E (longitude). If you are the first person to show up at these coordinates during the local office hours you will win the full lifetime SPIP license.

2007-12-11: Second Free SPIP License Stashed at 37deg 17:37N, 127deg 2:31E
As part of the SPIP Global Cache Hunt 2007 we have stashed a full SPIP license at 37deg 17:37N (latitude), 127deg 2:31E (longitude). If you are the first person to show up at these coordinates during the local office hours you will win the full lifetime SPIP license.

2007-12-10: Dr. Robert Ros Finds a Free SPIP License in Arizona
Dr. Robert Ros was the first person to show up at the published coordinates and claim the full SPIP License.

2007-11-21: Release of SPIP™ Version 4.6
SPIP 4.6 has been validated to be consistent with NIST on 11 roughness parameters.

2007-11-21: Earn $100 by Requesting a Feature or Reporting a Bug
The development of SPIP is user driven and your feedback is very valuable to us. Therefore, we will give you a $100 gift voucher for every feature request and bug report you send us for the rest of 2007.

2007-10-18: Free SPIP License Stashed at 33deg 21:27.56N, 111deg 58:28.27W
As part of the SPIP Global Cache Hunt 2007 we have stashed a full SPIP license at 33deg 21:27.56N (latitude), 111deg 58:28.27W (longitude). If you are the first person to show up at these coordinates during the local office hours you will win the full lifetime SPIP license.

2007-10-12: Image Metrology Named as Gazelle for 4th Consecutive Year
A gazelle is a company that has shown fast and positive growth over 4 years, doubling its revenues or more during this period.

2007-09-04: 5 Researchers Win a Handheld Garmin GPS
Today, the 5 winners of the Image Submission Campaign were drawn.

2007-08-02: Extension of Image Submission Campaign
After several requests we have decided to extend the SPIP version 4.5 Image Submission Campaign.

2007-06-20: Release of SPIP™ Version 4.5 compatible with Windows Vista
SPIP 4.5 is Windows Vista compatible and includes 28 free video tutorials showing how to save time and obtain robust and accurate results with SPIP.

2007-06-20: Get 10% Discount and Win a Handheld Garmin GPS
If you send us a microscopy image and allow us to use it for tutorials, examples, and application notes, you will be granted a 10% discount and participate in a raffle for 3 GPS devices.

2007-06-20: SPIP Global Cache Hunt 2007
Stay updated with SPIP Online and find a free SPIP license.

2007-02-06: Image Metrology Moves to Larger Facilities
Image Metrology A/S has moved to larger facilites north of Copenhagen.

2006-11-09: Release of SPIP™ Version 4.4
Image Metrology A/S releases SPIP™ version 4.0 with new utilities for interactive measurements, image arithmetic, and hardness analysis.

2006-11-01: Image Metrology joins research project on development of new catalysts
The goal is to develop new metal, oxide, and sulfide catalysts.

2006-10-12: Image Metrology sponsors students at NanoDTU with free software
Students at NanoDTU are now able to enhace their studies with a full version of SPIP.

2006-09-26: C-K Engineering becomes SPIP OEM distributor
C-K Engineering, Inc. and Image Metrology have entered an OEM agreement allowing C-K Engineering to distribute SPIP with their test instruments.

2006-09-12: Image Metrology Named as Gazelle for 3rd consecutive year by Dun & Bradstreet
A gazelle is a company that has shown fast and positive growth over 4 years, doubling its revenues or more during this period.

2006-09-12: Image Metrology receives AAA credit rating from Solidet and Dun & Bradstreet
In Scandinavia the AAA Rating is the highest credit rating for companies.

2006-07-07: Image Metrology Sponsors Nanotechnology Publication From Nature
Image Metrology supports Nature´s new nanotechnology initiative by sponsoring the pre-launch issue of Nature Nanotechnology.

2006-07-05: Image Metrology Releases Japanese Version of SPIP™ with a 10% Introduction Discount
Today, Image Metrology has released SPIP™ version 4.3. We are pleased to offer a 10% Summer Campaign discount on orders placed before August 31, 2006.

2006-07-03: Hysitron Incorporated Joins the Global Network of SPIP OEM Distributors
Hysitron Incorporated and Image Metrology have entered an OEM agreement allowing Hysitron Incorporated to distribute SPIP with their leading edge nano/micromechanical test instruments.

2006-07-03: Nanosurf Signs SPIP OEM Agreement
Nanosurf now offers SPIP together with the company´s renowned instruments.

2006-06-20: Micro Photonics Inc. Signs OEM Distributor Agreement
Today Micro Photonics has joined the global network of SPIP OEM distributors.

2006-06-08: ARDIC Instruments Co. Becomes SPIP OEM Distributor
ARDIC Instruments Co. now offers SPIP together with their range of analytical instruments for educational, research, and industrial applications in nanotechnology.

2006-06-06: Attocube Systems AG becomes OEM Distributor
attocube systems AG has signed an OEM agreement and is now able to bundle SPIP to the famous attocube nanopositioning systems.

2006-05-16: SPECS GmbH Signs OEM Distributor Agreement
We are pleased to announce that SPECS GmbH has signed an OEM agreement with Image Metrology. SPECS GmbH is now able to bundle the software with its instruments.

2006-03-09: Release of SPIP™ Version 4.2. with Extensive Discount on Multi User Licenses
Image Metrology A/S has relased SPIP™ version 4.2.

2006-02-07: Hitachi Kenki FineTech Co., Ltd. Signs OEM Distributor Agreement
Today Hitachi Kenki FineTech Co., Ltd. has joined the global network of SPIP OEM distributors.

2006-01-26: NanoAndMore USA Appointed SPIP Distributor
NanoAndMore USA has been appointed SPIP distributor for the USA.

2005-12-23: Kwok Fai Trading Co. Appointed SPIP Distributor for Hong Kong and China
Today Kwok Fai Trading Co. has been appointed SPIP distributor for Hong Kong and China.

2005-12-09: Job Opening in Software Development
Do you want to work with advanced image processing and have experience with windows programming? This position was occupied Feb. 01 2006, but we are looking for yet another software developer.

2005-12-07: Extension of SPIP 4.1 Campaign
After several requests, we have decided to extend the campaign into 2006.

2005-10-18: Release of SPIP™ Version 4.1. Save 47% on complete packages!
Image Metrology A/S has relased SPIP™ version 4.1.

2005-09-15: Image Metrology Again Named as Gazelle by the Leading Financial Newspaper ´Boersen´
A gazelle is a company that has shown fast and positive growth over 4 years, doubling its revenues or more during this period.

2005-08-29: Toshniwal Bros. Appointed General Distributor for India and Malaysia
Today Toshniwal Bros. (SR) Pvt Ltd has been appointed general SPIP distributor for India and Malaysia.

2005-08-25: Danish Micro Engineering (DME) Becomes a SPIP OEM Distributor
Danish Micro Engineering and Image Metrology have entered an OEM agreement allowing DME to distribute SPIP with their SPM instruments.

2005-07-18: STIL SA Signs OEM Distributor Agreement
STIL SA has joined the growing force of SPIP OEM distributors and is now able to bundle the software with its instruments.

2005-05-26: Release of SPIP™ Version 4.0
Image Metrology A/S has relased SPIP™ version 4.0 with an improved user interface.

2005-05-26: Discount on Updates and Upgrades
With the release of SPIP™ 4.0 Image Metrology has launched an Update and Upgrade campaign.

2005-05-26: On-Line SPIP™ Training Sessions
As part of the maintenance service for SPIP™ licenses, Image Metrology is introducing the ´Live Desktop Support´.

2005-03-07: JEOL Signs OEM Agreement
JEOL and Image Metrology have entered an OEM agreement. Thus, JEOL instruments can now be delivered with a SPIP license.

2005-01-26: Image Metrology Moves to New Facilities
Image Metrology A/S has moved to new and larger facilites at the science park located at the Technical University of Denmark.

2004-12-22: Ambios Technology, Inc. Signs OEM Agreement
Ambios Technology, Inc. provides industrial and academic researchers with affordable world-class surface analysis instrumentation.

2004-11-02: Dr. Hermann Schillers Wins Bang & Olufsen Raffle
Dr. Hermann Schillers from Westfälische Wilhelms-Universität Münster, Institute of Physiology II, wins Bang & Olufsen Beosound 1 music system.

2004-10-27: Release of SPIP™ Version 3.3
Image Metrology A/S has relased SPIP™ version 3.3.

2004-10-10: SII NanoTechnology, Inc. Signs OEM Agreement
SII NanoTechnology Inc. is Japanese corporation providing SPM systems and other nanotechnology instruments. SII NanoTechnology Inc. was founded as a spin off from Seiko Instruments Inc.

2004-10-01: Omicron NanoTechnology Announces New MATRIX SPM System Integrated with SPIP™
Omicron is a leading manufacturer for SPM systems for UHV.

2004-09-17: Image Metrology Named as Gazelle by the Leading Financial Newspaper ´Boersen´
A gazelle is a company that has shown fast and positive growth over 4 years, doubling its revenues or more during this period.

2004-09-12: Thermo Electron (Karlsruhe) GmbH Signs OEM Agreement
Thermo Electron is a provider of a wide range of laboratory equipment

2004-06-15: Image Metrology A/S Donates Educational Software to Nanoteket at DTU
Image Metrology A/S supports the education of nano techology engineers by donating educational SPIP™ software to the new teaching facility, Nanotektet at the Technical University of Denmark.

2004-06-07: Nanonis GmbH Signs OEM Agreement
Nanonis is a small high-tech company in the field of nanotechnology. The company provides software, hardware and services around scanning probe microscopy and nanotechnology and specializes in industrial automation, computer based measurements, LabVIEW and PXI systems.

2004-04-14: Release of SPIP™ Version 3.2
Image Metrology A/S has relased SPIP™ version 3.2.

2004-02-02: ATOS GmbH Signs OEM Agreement
ATOS GmbH develop products for Surface Metrology, Thin Film Characterization, Laser Technology, Fiber Connector End Production Systems, Mini Fabrication, Sensors and Components.

2004-02-01: Image Metrology Moves to Larger Facilities
Image Metrology A/S is moving to larger and better facilities and increasing the number of staff members.

2004-01-22: L.O.T.-Oriel GmbH Signs OEM Agreement
L.O.T.-Oriel GmbH is a respected and leading European Sales and Service organization for Lasers, Optics and other High Tech equipment for a variety of applications and markets.

2004-01-05: ESCO Corporation Appointed as Distributor in Korea


2004-01-01: TOYO Corporation Appointed as the General Distributor in Japan
TOYO Corporation is a leading distributor of various kinds of electronic measurement equipment and systems from all over the world.

0000-00-00: PROBLEM WITH EVALUATION LICENSE
We are currently having problem with our license server. Therefore we are not able to offer you an evaluation license at the moment. We are working on solving the problem. We apologize for the error.

0000-00-00: Job Opening in Software Development
We are currently looking for a Software Developer for development of state-of-the-art microscope software.

0000-00-00: Website Status Update
Our website, www.imagemet.com, has been out of service from February 28 through March 2 due to unforeseen events. We are sorry for any inconvenience caused.

0000-00-00: Bruker Nano Surface Division Becomes SPIP OEM Distributor
Bruker Nano Surface Division now offers SPIP together with their instruments.

RSS 2.0