NEW SOFTWARE: TOPOSTITCH™ - FAST AND ACCURATE STITCHING OF TOPOGRAPHIC IMAGES!
 
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Microelectronics and Nanotechnology
SPIP™ is used for image visualization and elaboration including statistical analysis, Fourier analysis, grain analysis, and fractal analysis.
Original STM Image
Unwanted stripes are seen.
 STM Image with stripe artifacts?
Plane Corrected
The plane correction has corrected the worst artifacts. The long stripes are now gone but some shorter line artifacts are still seen.
 Flattened STM Image?
Median Filtered
By median filtering the short line artifacts have now been removed and only minor artifacts remain.
 Median filtered SPM image?
The following references have contributed to this application:
Contributions by Vincenzo Palermo, Dr. Vincenzo Palermo, Dr. , Institute for Organic Synthesis and Photoreactivity, National Research Council, Bologna, Group head Dr. Derek Jones
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