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Extended Fourier Analysis
The Fourier Analysis Module enables you to detect and quantify repetitive patterns, such as atomic lattice structures and perform advanced filtering.
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Fourier spectrums contain important information about surface structures and distortion phenomena, but they can be difficult to interpret.
 
By a sub-pixel Fourier algorithm SPIP™ provides accurate information about selectable Fourier peaks, including wavelengths and the corresponding frequencies in Hz. This is particularly useful for diagnosing noise and vibration problems.
 
By defining a pair of Fourier peaks associated with the reciprocal unit cell, you can calculate the spatial unit cell automatically.
 
It is possible to edit the spectrum, perform Fourier filtering and learn how Fourier components correspond to image structures.
 
Thus, in addition to being a strong analytical tool, the Extended Fourier Analysis Module can bring new understanding to the relation between the spatial and the Fourier domain and serve as an educational toolbox.


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