** NEW SOFTWARE **      topoStitch™ - Fast and accurate stitching of topographic images!      ** NEW SOFTWARE **
 
Home
Image Metrology A/S

Phone:+45 469 234 00
Fax:+45 469 234 01
info@imagemet.com



Japanese (short)
Single Stuff

Nanoparticle Deposits Near the Contact Line of Pinned Volatile Droplets: Size and Shape Revealed by Atomic Force Microscopy
Published:
Soft Matter, 2011, Advance Article; DOI: 10.1039/C1SM05241A, Communication by Alexandros Askounis, Daniel Orejon, Vasileios Koutsos, Khellil Sefiane and Martin E. R. Shanahan.

Abstract:
We report on the structure of ring deposits formed following the free evaporation of a sessile droplet containing nanoparticles. The nanostructure of the evaporatively formed deposits was revealed using atomic force microscopy (AFM). The structures were found to form a peak about 5 microns wide and one micron high and to exhibit a gentle slope gradually increasing in height in the direction of the three phase contact line motion. A theory is proposed to explain the formation and shape of these deposits. A comparison between the theory and the experiments shows a very good qualitative and quantitative agreement.

Publication website

The following references have contributed to this publication:
Contributions by Vasileios Koutsos, Dr.Vasileios Koutsos, Dr.
RSS 2.0