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Jørgen Garnæs, Dr.
Danish Fundamental Metrology
Applications:
Nanometrology
Cover Illustration, Annual report of Danish Fundamental Metrology
Publications:
Comparison of Roughness Measurement with Atomic Force Microscopy and Interference Microscopy
Calibration of Step Heights and Roughness Measurements with Atomic Force Microscopes
Measuring Thickness of Semi-Fluid Layers Using Force Spectroscopy
Intercomparison of Scanning Probe Microscopes
Profiles of High Aspect Ratio Grating Determined by Optical Diffraction Microscopy and Atomic Force Microscopy
Nanobubble Trouble on Gold Surfaces
True Three-Dimensional Calibration of Closed Loop Scanning Probe Microscopes
