NEW SOFTWARE:
TOPOSTITCH™ - FAST AND ACCURATE STITCHING OF TOPOGRAPHIC IMAGES!
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Image Metrology A/S
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H. Sturm, Dr.
Federal Institute for Materials Research and Testing
Publications:
Materials Contrasts and Nanolithography Techniques in Scanning Force Microscopy and their Application to Polymers and Polymer Composites
Structure Formation on the Surface of Indium Phosphide Irradiated by Femtosecond Laser Pulses
SEM/EDX: Advanced Investigation of Structured Fire Residues and Residue Formation