SPIP Image Analysis Software
Image Metrology - Creator of SPIP
Welcome to Image Metrology - creator and supplier of SPIP™ or the “Scanning Probe Image Processor” - one of the world's best and most advanced software packages for processing and analyzing microscopic images at nano- and microscale.
Microscope Image Analysis Software
Our name, Image Metrology”, tells very much what we are doing: as metrology is the science of measurement, our focus is to create software that can perform measurements in images with the highest accuracy. SPIP™ includes several unique algorithms for automated measurement of natural lattice structures on the nanometer scale paired with advanced and accurate calibration techniques. These techniques together with a comprehensive set of other surface analytical tools are today made available in SPIP™ enabling SPM and other microscopy users to perform measurements easily and accurately.
Analyze Data from SPM, AFM & STM Microscopes
Our focus is to serve our SPM customers with the best available tools for analyzing SPM data. Thus, we are committed to deliver the best tools, not only for SPM image processing, but also for various spectroscopy data that can produced by SPM instruments, such as Force Spectroscopy acquired by Atomic Force Microscopes (AFM) and I-V spectroscopy recorded by Scanning Tunneling Microscopes (STM). Because the SPIP™ software is generic it is supporting a wide range of image types produced by other techniques, such as electron microscopes (SEM, TEM), interference microscopes, profilers and optical microscopes.
Technical support is our key for creating close relationships with our users and customer feedback is vital for fulfilling our mission, which is constantly to develop and deliver the best toolkit for processing and analyzing microscopic images at the nano- and microscale. Therefore, whenever you have a question, suggestion or even a complaint do not hesitate to contact us.