Image Metrology develops advanced software for processing and analyzing microscopy images at the nano- and microscale. We are a highly innovative company constantly developing new solutions in order to meet the demands from our high-tech customers. We supply our products directly to end users or through equipment manufacturers, and have an export rate of 98%.
Image Metrology A/S was founded in 1998 by Dr. Jan F. Jørgensen who developed the SPIP software as part of his industrial PhD project in cooperation with IBM Denmark, the Danish Institute of Fundemental Metrology and the Technical University of Denmark. Today, the company is a leading supplier of image processing software for "nano-microscopy".
Our mission is to provide our customers with state-of-the-art image processing software for microscopy including:
- Correction tools for creating the most accurate presentation of the "true" surface
- Automated analysis techniques assuring high accuracy, quality and cost efficiency
- Visualization and reporting tools enabling convincing and impressive communication of results