10:38 05.04.2017Release: SPIP 6.7!With the new and improved detection and splitting options SPIP™ version 6.7 has taken a giant leap towards easy and robust particle analysis in SPM and SEM images.
11:02 21.02.2017How to process information from Scanning Probe MicroscopySPM is a technique that uses a very sharp probe to scan over a surface in a raster pattern. When the probe is within atomic distance of the surface an AFM (Atomic Force Microscopy) probe can sense the repulsive and attractive forces from the surface.
13:57 13.02.2017The new addition in SPIP 6.6.5: Nano-Observer file formatsThere are several new enhancements in the new SPIP™ 6.5 especially for force spectroscopy that makes it much easier to explore and analyze huge data amounts...
11:47 20.11.2016Join us at MRS Fall Meeting & Exhibit in BostonWe will be exhibiting at the 2016 MRS Fall Meeting in Boston on November 29-December 1., and look forward to meeting you at our booth no. 1100 for free image processing advice and...
13:58 18.11.2016Nanosurf and Image Metrology renew OEM agreementNanosurf now offers SPIP™ as a standard component in their C3000 Advanced Spectroscopy Option, and as an optional component in their entire product range...
11:48 18.11.2016SPIP™ 6.6 featuring the new improved ImageMet Explorer™Image Metrology is proud to announce the release of SPIP™ 6.6 featuring the new improved ImageMet Explorer™ with more speed and efficiency for searching, sorting and exploring files...