22:06 07.01.2019Image Metrology has moved to DTU Science ParkWe have today moved to our new facilities at DTU Science Park, located on the campus of the Danish Technical University, Copenhagen and looking forward to being part of an inspiring environment among other innovative companies.
16:31 18.12.2018Happy holiday season and a prosperous New Year 2019We wish all our customers and partners a happy holiday season and a prosperous New Year 2019
15:29 11.12.201820 Years AnniversaryWe are celebrating our 20 years Anniversary and look forward to an even closer cooperation with our interesting customers with exciting projects, partners, distributors and colleagues in the coming years.
10:51 22.11.2018Receive MountainsSPIP™ for FREE with your SPIP™ PurchaseAll SPIP customers who have an active maintenance service at the time of release of MountainsSPIP 8 will be entitled to an upgrade to this new product, absolutely free of charge.
08:50 21.11.2018MRS Fall Meeting & Exhibit 2018Visit our booth #716 during the next MRS Fall Meeting & Exhibit from November 27 to 29 in Boston
12:12 17.09.2018SPIP™ release 6.7.5We are happy to announce the newest SPIP™ release 6.7.5 and invite you to download and try it yourself. Download SPIP In this release we have included many fixes and improvements requested by our SPIP users working with SPM and SEM images, see detailed release notes here:
12:17 10.08.2018Join us at the ECOSS conference, Aarhus DenmarkWe will be exhibiting at ECOSS2018 August 26-29 and look forward to meeting you at our booth no. 2 for free image processing advice and a SPIP demo. Feel free to bring your own image data from your research and our experts will be pleased to give you detailed advice on how to process your own data.
10:38 05.04.2017Release: SPIP 6.7!With the new and improved detection and splitting options SPIP™ version 6.7 has taken a giant leap towards easy and robust particle analysis in SPM and SEM images.
11:02 21.02.2017How to process information from Scanning Probe MicroscopySPM is a technique that uses a very sharp probe to scan over a surface in a raster pattern. When the probe is within atomic distance of the surface an AFM (Atomic Force Microscopy) probe can sense the repulsive and attractive forces from the surface.
13:57 13.02.2017The new addition in SPIP 6.6.5: Nano-Observer file formatsThere are several new enhancements in the new SPIP™ 6.5 especially for force spectroscopy that makes it much easier to explore and analyze huge data amounts...
11:47 20.11.2016Join us at MRS Fall Meeting & Exhibit in BostonWe will be exhibiting at the 2016 MRS Fall Meeting in Boston on November 29-December 1., and look forward to meeting you at our booth no. 1100 for free image processing advice and...
13:58 18.11.2016Nanosurf and Image Metrology renew OEM agreementNanosurf now offers SPIP™ as a standard component in their C3000 Advanced Spectroscopy Option, and as an optional component in their entire product range...
11:48 18.11.2016SPIP™ 6.6 featuring the new improved ImageMet Explorer™Image Metrology is proud to announce the release of SPIP™ 6.6 featuring the new improved ImageMet Explorer™ with more speed and efficiency for searching, sorting and exploring files...