12:17 10.08.2018Join us at the ECOSS conference, Aarhus DenmarkWe will be exhibiting at ECOSS2018 August 26-29 and look forward to meeting you at our booth no. 2 for free image processing advice and a SPIP demo. Feel free to bring your own image data from your research and our experts will be pleased to give you detailed advice on how to process your own data.
10:38 05.04.2017Release: SPIP 6.7!With the new and improved detection and splitting options SPIP™ version 6.7 has taken a giant leap towards easy and robust particle analysis in SPM and SEM images.
11:02 21.02.2017How to process information from Scanning Probe MicroscopySPM is a technique that uses a very sharp probe to scan over a surface in a raster pattern. When the probe is within atomic distance of the surface an AFM (Atomic Force Microscopy) probe can sense the repulsive and attractive forces from the surface.
13:57 13.02.2017The new addition in SPIP 6.6.5: Nano-Observer file formatsThere are several new enhancements in the new SPIP™ 6.5 especially for force spectroscopy that makes it much easier to explore and analyze huge data amounts...
11:47 20.11.2016Join us at MRS Fall Meeting & Exhibit in BostonWe will be exhibiting at the 2016 MRS Fall Meeting in Boston on November 29-December 1., and look forward to meeting you at our booth no. 1100 for free image processing advice and...
13:58 18.11.2016Nanosurf and Image Metrology renew OEM agreementNanosurf now offers SPIP™ as a standard component in their C3000 Advanced Spectroscopy Option, and as an optional component in their entire product range...
11:48 18.11.2016SPIP™ 6.6 featuring the new improved ImageMet Explorer™Image Metrology is proud to announce the release of SPIP™ 6.6 featuring the new improved ImageMet Explorer™ with more speed and efficiency for searching, sorting and exploring files...