10:38 05.04.2017Release: SPIP 6.7!With the new and improved detection and splitting options SPIP™ version 6.7 has taken a giant leap towards easy and robust particle analysis in SPM and SEM images.
11:02 21.02.2017How to process information from Scanning Probe MicroscopySPM is a technique that uses a very sharp probe to scan over a surface in a raster pattern. When the probe is within atomic distance of the surface an AFM (Atomic Force Microscopy) probe can sense the repulsive and attractive forces from the surface.
11:47 20.11.2016Join us at MRS Fall Meeting & Exhibit in BostonWe will be exhibiting at the 2016 MRS Fall Meeting in Boston on November 29-December 1., and look forward to meeting you at our booth no. 1100 for free image processing advice and...
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