A Giant Leap for Particle Analysis!

With the new and improved detection and splitting options SPIP™ version 6.7 has taken a giant leap towards easy and robust particle analysis in SPM and SEM images.

New features include:

• New Circle detection option in Particle Analysis
• Improvement of watershed detection algorithms
• Automatic particle splitting functions
• Texture analysis for SEM and other non-height images
• Improved XY scaling tool
• New Particle & Pore Analysis Breadth parameters
• Save and load Measure Shapes
• Automatic outlier masking in Plane Correction

Learn more by reading the SPIP 6.7 leaflet: