A Giant Leap for Particle Analysis!

With the new and improved detection and splitting options SPIP™ version 6.7 has taken a giant leap towards easy and robust particle analysis in SPM and SEM images.

New features include:

  • New Circle detection option in Particle Analysis
  • Improvement of watershed detection algorithms
  • Automatic particle splitting functions
  • Texture analysis for SEM and other non-height images
  • Improved XY scaling tool
  • New Particle & Pore Analysis Breadth parameters
  • Save and load Measure Shapes
  • Automatic outlier masking in Plane Correction

Learn more by reading the SPIP 6.7 leaflet:

Download SPIP