Image Metrology A/S
Phone:+45 469 234 00
Fax:+45 469 234 01

SPIP™ is the preferred software package for nano- and microscale image processing at high-tech companies and leading research institutes in more than 60 countries.

SPIP™ supports 103 file formats for various instrument types, including:

  • SEM, TEM
  • Interferometers
  • Confocal Microscopes
  • Profilers
  • Optical Microscopes
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Many of the world's most trusted brands use SPIP™ - here are a few of them:
SPIP™ is also used for academic research and has been referenced in 910 scientific publications.
The grain size measurement module is very helpful to measure individual nanoparticles deposited on mica. We use the height measured by AFM as the size (diameter) of the particle.
Don Chernoff, PhD., President, Advanced Surface Microscopy
Revision History
SPIP™ 6.3.1, released 2014-09-30

Revision History

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