Image Metrology


Lyngsø Allé 3A








Image processing software for nano- and microscale analysis | Image Metrology
Image Metrology A/S
Phone:+45 469 234 00
Fax:+45 469 234 01

SPIP™ is the preferred software package for nano- and microscale image processing at high-tech companies and leading research institutes in more than 61 countries.

SPIP™ supports 104 file formats for various instrument types, including:

  • SEM, TEM
  • Interferometers
  • Confocal Microscopes
  • Profilers
  • Optical Microscopes
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Many of the world's most trusted brands use SPIP™ - here are a few of them:
SPIP™ is also used for academic research and has been referenced in 1045 scientific publications.
I have been using SPIP since around 2009. We have multi-user licenses and I have trained many of my DuPont colleagues to use the various parts of the SPIP package. We use it for its intended use, to analyze data and images from several different scanning probe microscopes, but we also use it to analyze images from optical and electron microscopes and data from optical and stylus profilometry instruments as well. The package is extremely powerful and I have not found a type of data file that cannot be imported or read by the software. The particle and pore analysis is particularly powerful and we have used it to statistically analyze nano and microparticle size and shape from atomic force microscope and electron microscope images. We also use the particle and pore analysis to calculate wear volumes and quantify scratch damage and healing on the surface of polymers. The new profile analysis package is very intuitive and powerful, it allows us to compare profiles from many different tools to understand the size and shape of features at a variety of different length scales. It even enables correlation between surface morphology and optical images to understand the appearance of surfaces and defects. I no longer use the image or data analysis packages associated with the various instruments, I analyze all my data with SPIP.
Greg Blackman, DuPont CR&D
Revision History
SPIP™ 6.4.4, released 2015-10-23

Revision History

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