Image Metrology A/S
Phone:+45 469 234 00
Fax:+45 469 234 01

SPIP™ is the preferred software package for nano- and microscale image processing at high-tech companies and leading research institutes in more than 61 countries.

SPIP™ supports 103 file formats for various instrument types, including:

  • SEM, TEM
  • Interferometers
  • Confocal Microscopes
  • Profilers
  • Optical Microscopes
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Many of the world's most trusted brands use SPIP™ - here are a few of them:
SPIP™ is also used for academic research and has been referenced in 955 scientific publications.
For our activities SPIP is indispensable. Danish Fundamental Metrology use it as the only software tools for AFM analysis and calibrations of nanometer scale standards with international recognition. For special applications the possibility to write tailored plug-ins is unique and easy to use.
Jørgen Garnæs, Dr., Danish Fundamental Metrology
Revision History
SPIP™ 6.3.3, released 2014-12-17

Revision History

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