2009-06-24:
SPIP 5 - A Giant Leap for Particle and Pore Analysis More . . . | 
For our activities SPIP is indispensable. Danish Fundamental Metrology use it as the only software tools for AFM analysis and calibrations of nanometer scale standards with international recognition. For special applications the possibility to write tailored plug-ins is unique and easy to use.
Jørgen Garnæs, Dr., Danish Fundamental Metrology | SPIP™SPIP™ is the preferred software package for nano- and microscale image processing at high-tech companies and leading research institutes in more than 43 countries.
SPIP™ supports 82 file formats for various instrument types, including:
- SPM, AFM, STM
- SEM, TEM
- Interferometers
- Confocal Microscopes
- Profilers
- Optical Microscopes
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