2010-01-05:
NT-MDT America Inc. Becomes SPIP OEM Distributor More . . . | 
The grain size measurement module is very helpful to measure individual nanoparticles deposited on mica. We use the height measured by AFM as the size (diameter) of the particle. Don Chernoff, PhD., President, Advanced Surface Microscopy | SPIP™SPIP™ is the preferred software package for nano- and microscale image processing at high-tech companies and leading research institutes in more than 46 countries.
SPIP™ supports 84 file formats for various instrument types, including:
- SPM, AFM, STM
- SEM, TEM
- Interferometers
- Confocal Microscopes
- Profilers
- Optical Microscopes
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