Testimonials The grain size measurement module is very helpful to measure individual nanoparticles deposited on mica. We use the height measured by AFM as the size (diameter) of the particle. Don Chernoff, PhD., President, Advanced Surface Microscopy Great software - very powerful and versatile.
Kevin Robbie, Assistant Prof. and Canada Research Chair in Nanostructured Materials, Queen´s University I think SPIP is very user friendly and versalite software. I´ve used other commercial softwares also but the options available in SPIP are simply immense. Loveleen Kaur Brar, Indian Institute of Science The availability of the SPIP software has played a crucial role in enabling me to extract the kind of quantitative information that I really want out of my AFM images.
Harry J. Ploehn, Prof. , University of South Carolina, Department of Chemical Engineering I am pleased with the SPIP package, especially, with the fact that SPIP not only reads and processes images from commercial atomic force microscopes, but also reads and processes images from common white light interference microscopes. This dramatically increases the flexibility and wide scale usage of SPIP. Louis Hector, Jr., Dr. , General Motors R&D I like very much to work with SPIP software package. It is very flexible and user friendly. It is a powerful tool not only for SPM, STM data processing but also for other images. I always appreciate a scientific result sustained in a suggestive graphical way and, why not, artistic if possible. With SPIP, science can be also an art! Mirela Suchea, University of Crete For our activities SPIP is indispensable. Danish Fundamental Metrology use it as the only software tools for AFM analysis and calibrations of nanometer scale standards with international recognition. For special applications the possibility to write tailored plug-ins is unique and easy to use.
Jørgen Garnæs, Dr., Danish Fundamental Metrology SPIP is very helpful in tip characterization.
H.-Y. Nie, Ph.D. , The University of Western Ontario I really enjoy SPIP for processing both STM and AFM images we acquire with our scanning probe microscope. There are many very useful tools in our package which I am learning more about with each image I process and analyze. Diedrich Schmidt, PhD Candidate Research Assistant, Olmstead Research Group, University of Washington, Seattle, WA The more I show SPIP to my clients in R&D, the more they are talking about ordering copies for themselves Thomas Gardner, Dr., Boston Scientific, Inc. Some of the tools I´ve used so far include plane adjustment, FFT, gradient processing, histograms of height, rotation of image, to name a few; all of which are useful in the analysis of our SPM images.
Diedrich Schmidt, PhD Candidate Research Assistant, Olmstead Research Group, University of Washington, Seattle, WA SPIP is a good software and it is easy to work with it.
Bernard Desbat, Directeur de Recherche, The Laboratoire de Physicochimie Moléculaire(LPCM), Centre National de la Recherche Scientifique (CNRS) SPIP is the standard program for processing and presenting AFM data in our lab since 4 years. We appreciate that SPIP is frequently updated and that our suggestions and requirements were integrated in SPIP. Hermann Schillers, Dr. , Westfälische Wilhelms-Universität Münster, Institute of Physiology II I rely heavily on SPIP and appreciate the support that I and my students have received from Image Metrology.
Harry J. Ploehn, Prof. , University of South Carolina, Department of Chemical Engineering | ||||||||||
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