SPIP Continues as MountainsSPIP®

Please be informed that from now onwards our parent company Digital Surf is in charge of customer relations and sales and that the SPIP product is no more available for sale.

Try MountainsSPIP® for free
The good news is that many of the SPIP functions will continue in the MountainsSPIP® software and that all our SPIP customers having an active maintenance service are entitled to a MountainsSPIP® 8 license valid until the end of 2020, free of charge in addition to their SPIP license.
If you are eligible to benefit from this offer, the Digital Surf sales team will be in touch with you shortly to help you activate your free MountainsSPIP® license and assist with any questions you may have.
If you are having an active SPIP maintenance service we are still here to assist you and you are welcome to ask questions at support@imagemet.com.
A free trial version of MountainsSPIP® is available for download at https://www.digitalsurf.com/free-trial/. To learn more about the features of MountainsSPIP® products please visit https://www.digitalsurf.com/software-solutions/scanning-probe-microscopy/

Thank you for an inspiring time
I would like to take this opportunity to thank all our valued SPIP users, – it has been a great pleasure to serve you with new software functions, which you inspired us to develop over the years. I wish you every success with MountainsSPIP®, which I am convinced will be the state-of-the-art SPM image analysis software for many years to come.

The future
The future mission of Image Metrology will be research and development of new algorithms and functions supporting continued improvements of MountainsSPIP® and we will be pleased to engage in projects together with research institutes in the field of SPM and related techniques. So, if you have ideas for such R&D projects you are most welcome to contact us via info@imagemet.com.

Best regards,

Jan Friis Jørgensen, CEO

DTU Science Park

Image Metrology has moved to DTU Science Park

Image Metrology has moved to DTU Science Park

Today we moved to our new facilities at DTU Science Park, located on the campus of the Danish Technical University and looking forward to being part of an inspiring environment among other innovative companies. We are also looking forward to an even closer cooperation with DTU researchers and students.

20 Years Anniversary

20 Years Anniversary

We are proud to celebrate our company's 20 years anniversary and look back at our history during which we have had the honor to serve many customers with state-of-the-art software for microscopy.

The Short History

In December 1998, Image Metrology was established as a spin off company from DTU (Danish Technical University) and DFM (Danish Institute for Fundamental Metrology). The company was build on the SPIP (Scanning Probe Image Processor) software developed by Jan Friis Jørgensen during his PhD and post doc period at NIST. It was the perfect timing for starting a business, for  four main reasons:

  1.  Scanning Probe Microscopy was becoming a more mature technique and being used by an increasing number of research institutes.
  2.  Personal computers were becoming more powerful and advanced image processing software, previously limited to more expensive Unix workstations, could now be implemented on more common Windows based personal computers.
  3. The Internet had become mature and widely available, so it was easy to market and distribute SPIP test versions globally.
  4. There were only few software packages with limited functionalities available and SPIP could fulfil the demand for more powerful software.

It took only five months to mature and commercialize the SPIP software and receive the first orders. Since then SPIP has become the de facto standard for SPM image analysis and used by microscopists, researches and students worldwide.
During the years the focus of Image Metrology has always been on developing advanced and accurate image processing software, and yet easy to use, for customers demanding the very best. We are still committed to this mission, which we are now pursuing together with our mother company Digital Surf.

MountainsSPIPTM- The New Product

I 2014 Image Metrology was acquired by Digital Surf, www.digitalsurf.com, which came naturally as our products had a lot in common and complemented each other. By sharing our knowledge and development resources we could accomplish and create even more powerful and comprehensive software products. This vision will soon be materialized by the MountainsSPIP™ software package, www.imagemet.com/products/mountainsspip-8 , expected to enter the market in the first half year of 2019.
We are currently in a transition phase where Mountains® and SPIPTM are combined in to the new MountainsSPIPTM product, - and now is the perfect time to invest in SPIP as we for a limited time are offering an extra MountainsSPIP license for free, as soon as it is released.

The Future

We are still committed to serving the SPM community with the best software tools and will continue our innovative development of new features for MountainsSPIP and provide our customers with the best possible service. Therefore, we look forward to an even closer cooperation with our valued customers, partners, distributors and colleagues over the next many years. Share your SPIP and MountainsSPIP experiences and wishes with us - we are here for you.

Best regards,
Jan F. Jørgensen, CEO

Jan Friis Jørgensen, CEO Image Metrology

MountainsSPIP Software

Receive MountainsSPIP™ for FREE with your SPIP™ Purchase

Receive MountainsSPIP™ for FREE with your SPIP™ Purchase

Since SPM specialists Image Metrology and Digital Surf joined forces in 2014, development teams from both companies have been working hard to create the next generation of SPM image analysis software. The new product line, named MountainsSPIP 8™, will be unveiled at the MRS Fall Exhibition Boston on November 27-29, 2018 and made available to users in Q2 2019. Based on the industry-standard Mountains® platform, it will also include all the best SPIP™ interactivity and analytical tools.

All SPIP customers who have an active maintenance service at the time of release of MountainsSPIP 8 will be entitled to an upgrade to this new product, absolutely free of charge.

So,  make sure your SPIP maintenance service is renewed, even if it expired long time ago.

Who will receive a free MountainsSPIP™ license?

  • All SPIP customers having purchased a SPIP licenses after September 1st 2018
  • All SPIP customers having updated their maintenance service after September 1st 2018
  • All SPIP customers having an active maintenance service on the release date of MountainsSPIP 8.0.0

An example of the many new features that you will find in MountainsSPIP™ is Correlative Analysis where images acquired by different techniques and scaling can be overlaid and provide new insight, see below:

More about MountainsSPIP™

Find more information about MountainsSPIP™ here

MRS Fall Meeting & Exhibit 2018

MRS Fall Meeting & Exhibit 2018

We would be pleased to welcome you on our booth #716 during the next MRS Fall Meeting & Exhibit from November 27 to 29 in Boston, MA, USA. This year we are sharing the booth with our mother company Digital Surf
Meet us to get a live demo of SPIP and get the first sneak preview of the MountainsSPIP™ software.
More details here: www.mrs.org/fall2018

Learn more about MountainsSPIP™ here


Release: SPIP 6.7!

A Giant Leap for Particle Analysis!

With the new and improved detection and splitting options SPIP™ version 6.7 has taken a giant leap towards easy and robust particle analysis in SPM and SEM images.

New features include:

  • New Circle detection option in Particle Analysis
  • Improvement of watershed detection algorithms
  • Automatic particle splitting functions
  • Texture analysis for SEM and other non-height images
  • Improved XY scaling tool
  • New Particle & Pore Analysis Breadth parameters
  • Save and load Measure Shapes
  • Automatic outlier masking in Plane Correction

Learn more by reading the SPIP 6.7 leaflet:

Download SPIP

scanning probe microscopy

How to process information from Scanning Probe Microscopy

Scanning Probe Microscopy

Image Metrology's founder, Dr. Jan F. Jørgensen recently gave an interview discussing the field of Scanning Probe Microscopy, which below is re-produced for the knowledge of SPIP™ users.

The SPM Technique

scanning probe microscopyScanning Probe Microscopy or SPM, is a technique that uses a very sharp probe to scan over a surface in a raster pattern. When the probe is within atomic distance of the surface an AFM (Atomic Force Microscopy) probe can sense the repulsive and attractive forces from the surface. The height of the probe is controlled such that the force is kept constant meaning that also the distance to the surface is kept constant. Therefore, a topographic landscape image can be produced by recording the z position of the probe for the x, y positions.

Effectively the AFM probe traces over the surface of a substrate and records the surface topography as it does so.

Scanning Tunneling Microscopy

STM (Scanning Tunneling Microscopy) works in a similar manner to AFM but uses a different sensing method. In STM there is a bias voltage set between the probe and the surface and when in atomic distance to the surface a tunneling current can be measured by the probe.

Because both of the techniques involve scanning very close to the surface it is possible to obtain images with atomic resolution.

The SPM Advantages

scanning probe microscopyThe big advantage of SPM techniques compared to optical techniques is the ability to obtain height information and the unique capability of obtaining images at atomic resolution. SPM allows a lot of geometrical information to be extracted at a very detailed level.

To obtain geometrically correct images it is crucial that the movement of the probe relative to the surface can be controlled better than the desired resolution, which is a big challenge. It is almost impossible to create images where the pixels are acquired equidistantly and where there is no coupling between the axes. Even in the most perfect instrument problems with environmental noise, vibration and temperature changes will lead to imperfect images.

In SPIP™ we have implemented several methods to characterize imperfections and correct for them which allows extremely accurate measurements to be performed.